{"id":4818,"date":"2026-08-15T11:50:00","date_gmt":"2026-08-15T11:50:00","guid":{"rendered":"https:\/\/gk5l0g06kd.onrocket.site\/applications\/atomic-force-microscopy\/"},"modified":"2026-09-14T10:42:28","modified_gmt":"2026-09-14T10:42:28","slug":"atomic-force-microscopy","status":"publish","type":"application","link":"https:\/\/www.prior.com\/us\/applications\/atomic-force-microscopy\/","title":{"rendered":"Atomic Force Microscopy"},"content":{"rendered":"
Home<\/a><\/span> \u00bb Applications<\/a><\/span> \u00bb Atomic Force Microscopy<\/span><\/span><\/div>\n\n
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Atomic Force Microscopy Applications<\/h1>\n\n\n\n

Ultra-fast, high-resolution imaging with velocity control<\/h2>\n\n\n\n

Atomic force microscopy (AFM) is a type of scanning probe microscopy that operates by measuring the forces between a sharp tip and a sample surface. It creates a high-resolution image of a surface with atomic-scale detail and is used to image a wide variety of materials such as biological samples, polymers, and metals. AFM is also used to measure the mechanical properties of materials, such as their elasticity and friction.<\/p>\n\n\n\n

Common applications for this versatile technique include:<\/p>\n\n\n\n

Biotechnology: <\/strong>Imaging cells and tissues as well as studying the structure and properties of biological molecules such as proteins and DNA.<\/p>\n\n\n\n

Materials science: <\/strong>AFM is used to study and characterize the structure and properties of materials, such as metals, polymers, and ceramics. It is also used to measure the forces between surfaces.<\/p>\n\n\n\n

Nanotechnology: <\/strong>As well as allowing researchers to study the properties of nanomaterials, AFM is also used to fabricate nanomaterials.<\/p>\n\n\n\n

Semiconductor manufacturing:<\/strong> The atomic-resolution capabilities of AFM make it an essential part of semiconductor manufacturing where it is used for etching and inspecting silicon wafers.<\/p>\n\n\n\n

High-speed, high-precision piezo stages from Queensgate<\/h2>\n\n\n\n

Queensgate high-performance piezoelectric stages are used in the specimen scanner of an AFM to provide sub-nanometer spatial resolution. Dynamic performance is also important as the faster the Z dimension adjusts to the sample’s topography, the quicker the surface can be scanned in the X and Y axes. Speed is essential as it reduces measurement times and possible temperature drift.<\/p>\n\n\n\n

The closed loop velocity control, developed by Queensgate, enables high-quality, high-resolution imaging at raster speeds of up to 4 mm\/s for fast AFM.<\/p>\n\n\n\n

Large samples and payloads – such as silicon wafers – are accommodated with scan areas from 100 x 100 μm to 600 x 600 μm.<\/p>\n\n\n\n

Explore Queensgate products on nanopositioning.com:<\/h2>\n\n\n\n

NPS-XY-100D<\/a> Aluminum two axis 100µm x 100µm stage. <\/p>\n\n\n\n

NPS-XY-100A<\/a> Super Invar Two Axis 100µm x 100µm Stage<\/p>\n\n\n\n

NPS-X-15A\/B<\/a> Low Profile Fast 20 Micron Stage<\/p>\n\n\n\n

NPS-Z-15A<\/a> Ultra Low Drift 15 Micron Stage<\/p>\n\n\n\n

Learn more about nanopositioning in atomic force microscopy<\/h2>\n\n\n\n

Read the article: 'Fast AFM scanning: realizing the gains of closed-loop velocity control.'<\/a><\/p>\n\n\n\n

Download the poster: 'Large area high-speed atomic force microscopy with arbitrary scan path playback'.<\/a><\/p>\n\n\n\n

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