Atomic Force Microscopy

Ultra-fast, high-resolution imaging with velocity control

Atomic force microscopy (AFM) is a type of scanning probe microscopy that operates by measuring the forces between a sharp tip and a sample surface. It creates a high-resolution image of a surface with atomic-scale detail and is used to image a wide variety of materials such as biological samples, polymers, and metals. AFM is also used to measure the mechanical properties of materials, such as their elasticity and friction.

Common applications for this versatile technique include:

Biotechnology: Imaging cells and tissues as well as studying the structure and properties of biological molecules such as proteins and DNA.

Materials science: AFM is used to study and characterize the structure and properties of materials, such as metals, polymers, and ceramics. It is also used to measure the forces between surfaces.

Nanotechnology: As well as allowing researchers to study the properties of nanomaterials, AFM is also used to fabricate nanomaterials.

Semiconductor manufacturing: The atomic-resolution capabilities of AFM make it an essential part of semiconductor manufacturing where it is used for etching and inspecting silicon wafers.

High-speed, high-precision piezo stages from Queensgate

Queensgate high-performance piezoelectric stages are used in the specimen scanner of an AFM to provide sub-nanometer spatial resolution. Dynamic performance is also important as the faster the Z dimension adjusts to the sample’s topography, the quicker the surface can be scanned in the X and Y axes. Speed is essential as it reduces measurement times and possible temperature drift.

The closed loop velocity control, developed by Queensgate, enables high-quality, high-resolution imaging at raster speeds of up to 4 mm/s for fast AFM.

Large samples and payloads – such as silicon wafers – are accommodated with scan areas from 100 x 100 μm to 600 x 600 μm.